Combining negative binomial and weibull distributions for yield and reliability prediction

IEEE Design and Test of Computers

Volumn 23, Issue 2, 2006, Pages 110-116

  Barnett, Thomas S ^a   Grady, Matt ^a   Purdy, Kathleen G ^a   Singh, Adit D ^b  

^a IBM   (United States)

^b AUBURN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; DATA STRUCTURES; RELIABILITY; WEIBULL DISTRIBUTION;

RELIABILITY FAILURES; RELIABILITY PREDICTION;

INTEGRATED CIRCUIT TESTING;

EID: 33645816786     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/MDT.2006.38     Document Type: Article

References (10)

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