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Volumn 23, Issue 4, 2006, Pages 1023-1025

Structural, morphology and optical properties of epitaxial ZnO films grown on Al2O3 by MOCVD

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ALUMINUM OXIDE; CRYSTAL ORIENTATION; EPITAXIAL GROWTH; II-VI SEMICONDUCTORS; METALLIC FILMS; OPTICAL PROPERTIES; ZINC OXIDE; ZINC SULFIDE;

HIGH QUALITY; MOCVD METHODS; STRONG LUMINESCENCE; STRUCTURAL MORPHOLOGY; TRANSMISSION ELECTRONIC MICROSCOPIES;

CRYSTALLITES;

EID: 33645551863 PISSN: 0256307X EISSN: 17413540 Source Type: Journal
DOI: 10.1088/0256-307X/23/4/072 Document Type: Article

Times cited : (2)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.