Computation of the polarization due to the ferroelectric layer in a stacked capacitor from Sawyer-Tower hysteresis measurements

Journal of Applied Physics

Volumn 93, Issue 1, 2003, Pages 522-532

  Bouregba, R ^a   Poullain, G ^a  

^a UNIVERSITÉ DE CAEN   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CERAMIC CAPACITORS; COMPUTATIONAL METHODS; DIELECTRIC FILMS; ELECTRIC CONDUCTIVITY; HYSTERESIS; INTERFACES (MATERIALS); LEAKAGE CURRENTS; NUMERICAL METHODS; PERMITTIVITY; POLARIZATION; REMANENCE;

SWITCHING DOMAINS;

FERROELECTRIC THIN FILMS;

EID: 0037249378     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1527212     Document Type: Article

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