Aspects regarding measurement of thickness of intergranular glassy films

Journal of Microscopy

Volumn 221, Issue 1, 2006, Pages 46-62

  Bhattacharyya, S ^a   Subramaniam, A ^a   Koch, C T ^a   Ruhle M ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

Fourier filtering; Fresnel fringes; High resolution electron microscopy; Intergranular glassy film; Si3N4; SrTiO3

Indexed keywords

AMORPHOUS FILMS; AMORPHOUS SILICON; CERAMIC MATERIALS; EXTRAPOLATION; FOURIER TRANSFORMS; GLASS; GRAIN BOUNDARIES; HIGH RESOLUTION ELECTRON MICROSCOPY; IRON COMPOUNDS; MAGNESIUM COMPOUNDS; NANOCOMPOSITES; NITROGEN COMPOUNDS; SILICON CARBIDE; TRANSMISSION ELECTRON MICROSCOPY;

'CURRENT; FOURIER-FILTERING; FRESNEL; FRESNEL CONTRASTS; FRESNEL FRINGE; HIGH RESOLUTION; HIGH-RESOLUTION MICROGRAPHS; INTERGRANULAR GLASSY FILMS; LATTICE FRINGES; MEASUREMENTS OF;

TITANIUM COMPOUNDS;

SILICON CARBIDE; SILICON NITRIDE; STRONTIUM; TITANIUM DIOXIDE;

ALGORITHM; ARTICLE; CERAMICS; CONTRAST; CRYSTAL; FILM; FOURIER ANALYSIS; INTERGRANULAR GLASSY FILM; PRIORITY JOURNAL; STOICHIOMETRY; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 33645275219     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2006.01541.x     Document Type: Article

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