Determination of Grain-Boundary Film Thickness by the Fresnel Fringe Imaging Technique

Journal of the European Ceramic Society

Volumn 18, Issue 15, 1998, Pages

  Jin, Q ^a   Wilkinson, D S ^a   Weatherly, G C ^a  

^a MCMASTER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; GRAIN BOUNDARIES; IMAGING TECHNIQUES; SILICON NITRIDE; THICKNESS MEASUREMENT;

FRESNEL FRINGE IMAGING (FFI) TECHNIQUE;

CERAMIC MATERIALS;

EID: 0032307156     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0955-2219(98)00140-x     Document Type: Article

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