Reliability screening of diode lasers by multispectral infrared imaging

Journal of Applied Physics

Volumn 99, Issue 5, 2006, Pages

  Kozlowska, Anna ^a   Wawrzyniak, Piotr ^a   Malag, Andrzej ^a   Teodorczyk, Marian ^a   Tomm, Jens W ^b   Weik, Fritz ^b  

^a ukasiewicz Research Network Institute of Microelectronics and Photonics   (Poland)

^b MAX BORN INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; DEGRADATION; INFRARED IMAGING; LUMINESCENCE; SCREENING; THERMOGRAPHY (IMAGING);

ENHANCED LUMINESCENCE; FOURIER TRANSFORM PHOTOCURRENT; MULTISPECTRAL INFRARED (IR) IMAGING;

SEMICONDUCTOR LASERS;

EID: 33645217137     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2178390     Document Type: Article

References (9)

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