Thermal properties of high-power diode lasers investigated by micro-thermography

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5711, Issue , 2005, Pages 158-165

  Kozłowska, Anna ^a   Weik, Fritz ^b   Tomm, Jens W ^b   Mal, Andrzej ^a   Latoszek, Mateusz ^a   Wawrzyniak, Piotr ^a   Teodorczyk, Marian ^a   Dobrzański, Lech ^a   Zbroszczyk, Mariusz ^a   Bugajski, Maciej ^a  

^a ukasiewicz Research Network Institute of Microelectronics and Photonics   (Poland)

^b MAX BORN INSTITUT   (Germany)

Author keywords

Defect recognition; Heat flow; High power diode lasers; Hot spots; Modeling; Reliability; Thermal properties; Transient temperature

Indexed keywords

COMPUTER SIMULATION; DEGRADATION; HEAT TRANSFER; HETEROJUNCTIONS; RELIABILITY; SEMICONDUCTING ALUMINUM COMPOUNDS; THERMODYNAMIC PROPERTIES; THERMOGRAPHY (TEMPERATURE MEASUREMENT);

DEFECT RECOGNITION; HEAT FLOW; HIGH-POWER DIODE LASERS; HOT SPOTS; TRANSIENT TEMPERATURE;

SEMICONDUCTOR LASERS;

EID: 21844436791     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.588957     Document Type: Conference Paper

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