Reliability counts for laser diodes

Photonics Spectra

Volumn 37, Issue 7, 2003, Pages 55-56

  Johnson, Lawrence A ^a  

^a ILX Lightwave Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LIFE TESTING;

CONTROL SYSTEMS; COSTS; MARKETING; PUMPING (LASER); RELIABILITY;

SEMICONDUCTOR LASERS;

EID: 0041305818     PISSN: 07311230     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (1)

1. Franklin R. Nash (1993). Estimating Device Reliability: Assessment of Credibility, Kluwer Academic Publishers, Boston.