Characterization of As-doped, p-type ZnO by x-ray absorption near-edge structure spectroscopy

Applied Physics Letters

Volumn 88, Issue 11, 2006, Pages

  Vaithianathan, Veeramuthu ^a   Lee, Byung Teak ^a   Chang, Chang Hwan ^b   Asokan, Kandasami ^c   Kim, Sang Sub ^a  

^a Chonnam National University   (South Korea)

^b Research Institute of Industrial Science and Technology (RIST)   (South Korea)

^c INTER UNIVERSITY ACCELERATOR CENTRE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

DOPING (ADDITIVES); SPECTROSCOPIC ANALYSIS; X RAY ANALYSIS; ZINC OXIDE;

LOCAL STRUCTURE; P-TYPE CONDUCTION; X-RAY ABSORPTION NEAR-EDGE STRUCTURE (XANES) SPECTROSCOPY;

ABSORPTION;

EID: 33645138287     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2186383     Document Type: Article

References (25)

1. D. C. Look, Mater. Sci. Eng., B 80, 383 (2001).
2. S. J. Pearton, D. P. Norton, K. Ip, Y. W. Heo, and T. Steiner, Superlattices Microstruct. 34, 3 (2003).
3. D. B. Laks, C. G. Van de Walle, G. F. Neumark, and S. T. Pantelides, Appl. Phys. Lett. 63, 1375 (1993).
4. S. B. Zhang, S. H. Wei, and A. Zunger, Phys. Rev. B 63, 075205 (2001).
5. C. H. Park, S. B. Zhang, and S.-H. Wei, Phys. Rev. B 66, 073202 (2002).
6. D. C. Look, D. C. Reynolds, C. W. Litton, R. L. Jones, D. B. Eason, and G. Cantwell, Appl. Phys. Lett. 81, 1830 (2002).
7. Z. G. Yu, H. Gong, and P. Wu, Appl. Phys. Lett. 86, 212105 (2005).
8. V. Vaithianathan, B.-T. Lee, and S. S. Kim, Appl. Phys. Lett. 86, 062101 (2005).
9. C. Morhain, M. Teisseire, S. Vézian, F. Vigué, F. Raymond, P. Lorenzini, J. Guion, G. Neu, and J.-P. Faurie, Phys. Status Solidi B 229, 881 (2002).
10. Y. R. Ryu, T. S. Lee, J. H. Leem, and H. W. White, Appl. Phys. Lett. 83, 4032 (2003).
11. D. C. Look, G. M. Renlund, R. H. Burgener II, and J. R. Sizelove, Appl. Phys. Lett. 85, 5269 (2004).
12. T. S. Jeong, M. S. Han, C. J. Youn, and Y. S. Park, J. Appl. Phys. 96, 175 (2004).
13. S. Limpijumnong, S. B. Zhang, S.-H. Wei, and C. H. Park, Phys. Rev. Lett. 92, 155504 (2004).
14. J. Stohr, NEXAFS Spectroscopy (Springer, Berlin, 1992).
15. F. E. Huggins, N. Shah, G. P. Huffman, and J. D. Robertson, Fuel Process. Technol. 65-66, 203 (2000).
16. T. R. Rüde, A. Ebel, A. Tretner, and M. Isenbeck-Schröter, HASYLAB Annual Report, 2002, 〈http://www-hasylab.desy.de/science/ annual_reports/2002_report/part1/contrib/45/7306.pdf〉.
17. M. Bancroft, Proceedings Australian Synchrotron: A Workshop for Potential Users, University of Melbourne, Melbourne, Australia, January 2003 〈https://www.synchrotron.vic.gov.au/files/documents/ Mike_Bancroft. pdf〉
18. Y. Izumi, F. Kiyotaki, T. Minato, D. Masih, and Y. Seida, Phys. Scr., T 115, 933 (2005).
19. X-ray data Book (Lawrence Berkeley National Laboratory, Livermore, CA, 2001) 〈http://xdb.lbl.gov〉
20. G. Pangitinan, R. Sorryakumar, B. Chelluri, and T. Y. Chang, Phys. Rev. Lett. 62, 551 (1989).
21. G. Sankar, R. G. Bell, J. M. Thomas, M. W. Anderson, P. A. Wright, and J. Rocha, J. Phys. Chem. 100, 449 (1996);
22. Z. Y. Wu, G. Ouvrard, P. Moreau, and C. R. Natoli, Phys. Rev. B 55, 9508 (1997).
23. K. Asokan, J. C. Jan, J. W. Chiou, W. F. Pong, H. M. Tsai, H. L. Shih, H. Y. Chen, H. C. Hsueh, C. C. Chuang, Y. K. Chang, Y. Y. Chen, and I. N. Lin, J. Phys.: Condens. Matter 13, 11087 (2001), and references therein.
24. F. M. F. de Groot, M. Grioni, J. C. Fuggle, J. Ghijsen, G. A. Sawatzky, and H. Petersen, Phys. Rev. B 40, 5715 (1989).
25. C. L. Dong, C. Persson, L. Vayssieres, A. Augustsson, T. Schmitt, M. Mattesini, R. Ahuja, C. L. Chang, and J-H. Guo, Phys. Rev. B 70, 195325 (2004).