Modeling of dielectric behaviors of multilayer ceramic capacitors under a direct current bias field

Journal of the American Ceramic Society

Volumn 89, Issue 2, 2006, Pages 550-556

  Wen, Hai ^a   Wang, Xiaohui ^a   Chen, Renzheng ^a   Li, Longtu ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; GRAIN SIZE AND SHAPE; RESIDUAL STRESSES; SINTERING; STABILITY; STRONTIUM;

CAMPBELL MODEL; MULTILAYER CERAMIC CAPACITORS; STRONTIUM DOPING;

CERAMIC CAPACITORS;

EID: 33645133806     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2005.00742.x     Document Type: Article

References (35)

1. H. Kishi, Y. Mizuno, and H. Chazono, "Base-Metal Electrode-Multilayer Ceramic Capacitors: Past, Present and Future Perspectives," Jpn. J. Appl. Phys., 42, 1-15 (2003).
2. Y. Sakabe, T. Takagi, and K. Wakino, "Dielectric Materials for Base-Metal Multilayer Ceramic Capacitors," J. Am. Ceram. Soc., 69, 103-15 (1986).
3. H. Saito, H. Chazono, H. Kishi, and N. Yamaoka, "X7R Multilayer Ceramic Capacitors with Nickel Electrodes," Jpn. J. Appl. Phys., 9B, 2307-10 (1991).
4. Y. Park and H.-G. Kim, "Dielectric Temperature Characteristics of Cerium-Modified Barium Titanate Based Ceramics with Core-Shell Grain Structure," J. Am. Ceram. Soc., 80 [1] 106-12 (1997).
5. 3," J. Am. Ceram. Soc., 67 [4] 249-54 (1984).
6. C. Metzmacher and K. Albertsen, "Microstructural Investigations of Barium Titanate-Based Material for Base Metal Electrode Ceramic Multilayer Capacitor," J. Am. Ceram. Soc., 84 [4] 821-6 (2001).
7. 4 Ternary System: II, Stability of So-Called "Core-Shell" Structure," J. Am. Ceram. Soc., 83 [1] 101-6 (2000).
8. 3 Ceramics." Jpn. J. Appl. Phys., 41, 6934-7 (2002).
9. 3-Based Ni-MLCC," J. Eur. Ceram. Soc., 21, 1649-52 (2001).
10. 33," Am. Ceram. Soc. Bull., 66 [8] 1230 (1987).
11. C. J. Choi and Y. Park, "The X7R Phenomena in the Core-Shell Structured Ceramics," Ceram. Trans., 8, 148-56 (1990).
12. Y. Park and Y. H. Kim, "The Dielectric Temperature Characteristic of Additives Modified Barium Titanate Having Core-Shell Structured Ceramics," J. Mater. Res., 10 [11] 2770-6 (1995).
13. 3 Ceramics in the Paraelectric State," J. Mater. Res., 10 [6] 1411-7 (1995).
14. 3 Coplanar Capacitor," Appl. Phys. Lett., 63, 3078 (1993).
15. 3-Doped Barivim Strontium Titanate for Application in Phased Array Antennas," Jpn. J. Appl. Phys., 38, 5154-61 (1999).
16. 3-Doped Barium Strontium Titanate in the Paraelectric State," Jpn. J. Appl. Phys., 39, 2690-5 (2000).
17. J. C. Slater, "The Lorentz Correction in Barium Titanate," Phys. Rev., 78, 748 (1950).
18. G. Rupprecht, R. O. Bell, and B. D. Silverman, "Nonlinearity and Microwave Losses in Cubic Strontium Titanate," Phys. Rev., 123, 97 (1961).
19. Kenneth M. Johnson, "Variation of Dielectric Constant with Voltage in Ferroelectrics and its Application to Parametric Devices," J. Appl. Phys., 33, 2826-31 (1962).
20. C. K. Campbell, J. D. van Wyk, H. M. F. Karl, and J. J. Schoeman, "Aspects of Modeling of High Voltage Ferroelectric Nonlinear Ceramic Capacitors," IEEE Trans. Components Hybrids Manuf. Techno., 15 [2] 245-51 (1992).
21. C. K. Campbell, J. D. van Wyk, M. F. Karl Holm, J. J. R. Prinsloo, and J. J. Schoeman, "Relaxation Effects in High-Voltage Barium Titanate Nonlinear Ceramic Disk Capacitors," IEEE Trans. Components Hybrids Manuf. Technol., 16 [4] 418-23 (1992).
22. H. Chazono and H. Kishi, "DC-Electrical Degradation of the BT-Based Material for Multilayer Ceramic Capacitor with Ni Internal Electrode: Impedance Analysis and Microstructure," Jpn. J. Appl. Phys., 40, 5624-9 (2001).
23. T. Nomura, N. Kawano, J. Yamamatsu, T. Arashi, Y. Nakano, and A. Sato, "Aging Behavior of Ni-Electrode Multilayer Ceramic Capacitors with x7r Characteristics," Jpn. J. Appl. Phys., 34, 5389-95 (1995).
24. W. Heywang, "Resistivity Anomaly in Doped Barium Titanate." J. Am. Ceram. Soc., 47, 484 (1964).
25. H. D. Park and D. A. Payne, "Characterization of Internal Boundary Capacitors"; pp. 242-53 in Grain Secondary Phenomena in Electronic Ceramics, Vol. 1, Edited by L. M. Levinson and D. C. Hill. American Ceramic Society, Columbus, OH, 1981.
26. O. Steiner, A. K. Tagantsev, E. L. Colla, and N. Setter, "Uniaxial Stress Dependence of the Permittivity of Electroceramics," J. Eur. Ceram. Soc., 19, 1243-6 (1999).
27. T. M. Shaw, Z. Suo, M. Huang, E. Liniger, R. B. Laibowitz, and J. D. Baniecki, "The Effect of Stress on the Dielectric Properties of Barium Strontium Titanate Thin Film," Appl. Phys. Lett., 75, 2129 (1999).
28. 3-Based Ni-MLCCs with X7R Characteristics," J. Mater. Sci. Mater. Electron., 15, 253-9 (2004).
29. 3/Ni MLCCs," J. Eur. Ceram. Soc., 23, 1427-34 (2003).
30. H. Shin, J. S. Park, S. Kim, H. S. Jung, and K. S. Hong, "Investigation of Useful or Deleterious Residual Thermal Stress Component to the Capacitance of a Multilayer Ceramic Capacitor," Microelectron. Eng., 77, 270-6 (2005).
31. Y. Nakano, T. Nomura, and T. Takenaka, "Residual Stress of Multilayer Ceramic Capacitors with Ni-Electrodes (Ni-MLCCs)," Jpn. J. Appl. Phys., 42, 6041-4 (2003).
32. Y. Nakano, T. Nomura, and T. Takenaka, "Number of Dielectric Layers Dependence of Dielectric Properties and Residual Stress of Multilayer Ceramic Capacitors with Ni Electrode," Jpn. J. Appl. Phys., 43, 5398-403 (2004).
33. Y. Nakano, T. Nomura, and T. Takenaka, "Residual Stress of Multilayer Ceramic Capacitors (MLCCs)," Key Eng. Mater., 248, 179-82 (2003).
34. 3 with Various Grain Sizes in the Paraelectric State," Jpn. J. Appl. Phys., 36, 4359-68 (1997).
35. 4 Based X7R Ceramic Materials," Key Eng. Mater., 280-283, 65-8 (2005).