Number of dielectric layers dependence of dielectric properties and residual stress of multilayer ceramic capacitors with Ni electrodes

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 43, Issue 8 A, 2004, Pages 5398-5403

  Nakano, Yukie ^a   Nomura, Takeshi ^a   Takenaka, Tadashi ^b  

^a TDK CORPORATION   (Japan)

^b TOKYO UNIVERSITY OF SCIENCE   (Japan)

Author keywords

Capacitance aging; Capacitance change; Dielectric layer; Electric field; Lattice parameter; Residual stress

Indexed keywords

AGING OF MATERIALS; CAPACITANCE; CRYSTAL STRUCTURE; DIELECTRIC FILMS; ELECTRIC FIELDS; ELECTRODES; LATTICE CONSTANTS; NICKEL; RESIDUAL STRESSES; X RAY DIFFRACTION ANALYSIS;

CAPACITANCE CHANGE; DIELECTRIC LAYERS; MULTILAYER CERAMIC CAPACITORS (MLCC);

CERAMIC CAPACITORS;

EID: 6344284620     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.43.5398     Document Type: Article

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