Residual stress of multilayer ceramic capacitors (MLCCs)

Key Engineering Materials

Volumn 248, Issue , 2003, Pages 179-182

  Nakano, Yukie ^a   Nomura, Takeshi ^a   Takenaka, Tadashi ^b  

^a TDK CORPORATION   (Japan)

^b TOKYO UNIVERSITY OF SCIENCE   (Japan)

Author keywords

Anisotropy; Capacitance change; Dielectric constant; Multilayer ceramic capacitor; Residual stress

Indexed keywords

BARIUM TITANATE; CAPACITANCE; COMPRESSIVE STRESS; DIELECTRIC MATERIALS; PERMITTIVITY; RESIDUAL STRESSES; SURFACES; THERMAL EFFECTS; X RAY DIFFRACTION ANALYSIS;

COMPRESSIVE RESIDUAL STRESS; MULTILAYER CERAMIC CAPACITOR; TEMPERATURE DEPENDENCE;

CERAMIC CAPACITORS;

EID: 0042322235     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: None     Document Type: Article

References (6)

1. T.Nomura, S.Sumita, Y.Nakano, K.Nishiyama, Proc.5thUS-1.japan Seminar on Dielectric and Piezoelectric Ceramics, (1990) 29-32.
2. R. Waser, T.Baiatu and K.Hardtl, J.Am.Ceram.Soc., 3 (1990) 1645-1653.
3. N.Fujikawa, NipponCeramiics Kyokai Denshizairyou-bukai, (1990) 86
4. H.Kabasawa, H.Saitoh, S. Tosaka, NEEDS&SEEDS, 10 (1994) 15-18.
5. W.Carlson, T.Rutt, M. Wild, Ferroelectric Letters, 21 (1996) 1-9.
6. H.Chazono, Y.Inomata, N.Kohzu and H.Kishi: Key Engineering Materials Vols.169-170(1999)31-34