Residual stress of multilayer ceramic capacitors with Ni-electrodes (Ni-MLCCs)

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 42, Issue 9 B, 2003, Pages 6041-6044

  Nakano, Yukie ^a   Nomura, Takeshi ^a   Takenaka, Tadashi ^b  

^a TDK CORPORATION   (Japan)

^b TOKYO UNIVERSITY OF SCIENCE   (Japan)

Author keywords

Capacitance aging; Capacitance change; Dielectric constant; MLCCs; Residual stress

Indexed keywords

CAPACITANCE MEASUREMENT; DIELECTRIC PROPERTIES; ELECTRODES; MULTILAYERS; PERMITTIVITY MEASUREMENT; RESIDUAL STRESSES; X RAY DIFFRACTION ANALYSIS;

CAPACITANCE AGING; CAPACITANCE CHANGE; MULTILAYER CERAMIC CAPACITORS; NICKEL ELECTRODES;

CERAMIC CAPACITORS;

EID: 0344309144     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.6041     Document Type: Article

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