Higher order nonlinear dielectric imaging using scanning nonlinear dielectric microscopy

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 40, Issue 6 B, 2001, Pages 4349-4353

  Cho, Y ^a   Ohara, K ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

Nonlinear dielectric constant; Scanning nonlinear dielectric microscopy; Scanning probe microscopy; Surface layer observation

Indexed keywords

IMAGING TECHNIQUES; MICROSCOPIC EXAMINATION; NONLINEAR OPTICS; OPTICAL RESOLVING POWER; PERMITTIVITY MEASUREMENT; SURFACE PROPERTIES; SURFACE STRUCTURE; THICKNESS MEASUREMENT;

SCANNING NONLINEAR DIELECTRIC MICROSCOPY;

FERROMAGNETIC MATERIALS;

EID: 0035357396     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.40.4349     Document Type: Article

References (6)