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Volumn 29, Issue 1, 2006, Pages 137-142

Atomic force microscopy applied to immunoassays;Microscopia de força atômica aplicada em imunoensaios

Author keywords

Antigen antibody; Atomic force microscopy; Immunoassay

Indexed keywords


EID: 33644923213     PISSN: 01004042     EISSN: 01004042     Source Type: Journal    
DOI: 10.1590/s0100-40422006000100024     Document Type: Article
Times cited : (10)

References (67)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.