A hysteresis model for a vanadium dioxide transition-edge microbolometer

IEEE Transactions on Instrumentation and Measurement

Volumn 50, Issue 4, 2001, Pages 1030-1035

  De Almeida, Luiz Alberto Luz ^a,b,c   Deep, Gurdip Singh ^a,c   Nogueira Lima, Antonio Marcus ^a,c   Neff, Helmut Franz ^c   Freire, Raimundo Carlos Silvério ^c  

^a IEEE   (Brazil)

^b FEDERAL UNIVERSITY OF BAHIA   (Brazil)

^c FEDERAL UNIVERSITY OF PARAÍBA   (Brazil)

Author keywords

Bolometer; Hysteresis modeling; Metal insulator transition; Preisach model; Thermal radiation; Vanadium dioxide

Indexed keywords

TRANSITION-EDGE MICROBOLOMETERS;

HEAT RADIATION; HYSTERESIS; METAL INSULATOR TRANSITION; SENSORS; THIN FILMS; VANADIUM COMPOUNDS;

BOLOMETERS;

EID: 0035414672     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.948321     Document Type: Conference Paper

References (10)

1. Bolometric and noise properties of elements for uncooled IR arrays based on vanadium dioxide films
2. Vanadium dioxide films for optical switching and detection
3. 2 film near the metal-insulator transition
4. 3
5. Ferromagnetic hysteresis
6. Ber Die Magnetische Nachwirkung
7. Martensitic effects in the metal-insulator phase transition in a vanadium dioxide film
8. Simplex method for function minimization