Application of SIMS to silver tarnish at the British Museum

Applied Surface Science

Volumn 203-204, Issue , 2003, Pages 789-792

  Hallett, K ^c   Thickett, D ^a   McPhail, D S ^b   Chater, R J ^b  

^a BRITISH MUSEUM   (United Kingdom)

^b IMPERIAL COLLEGE LONDON   (United Kingdom)

^c NONE

Author keywords

Atmospheres; Corrosion; SEM; Silver; SIMS; Tarnish; XPS

Indexed keywords

COMPOSITION; CORROSION; MUSEUMS; SCANNING ELECTRON MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; X RAY PHOTOELECTRON SPECTROSCOPY;

SILVER TARNISH;

SILVER;

EID: 0346338690     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00823-1     Document Type: Conference Paper

References (3)

1. Franey T.P., Kammlott G.W., Graedel T.E. Corros. Sci. 25(2):1985;133-143.
2. F.W. Billmeyer, M. Saltzmann, Principles of Color Technology, 2nd Edition, Wiley/Interscience, New York, 1981, pp. 65-69.
3. Eccles A.W., Steele T.A., Robinson A.W. Appl. Surf. Sci. 144-145:1999;106-112.