A new X-ray transmission-reflection scheme for the study of deeply buried interfaces using high-energy microbeams

Physica B: Condensed Matter

Volumn 336, Issue 1-2, 2003, Pages 46-55

  Reichert, H ^a   Honkimaki V ^b   Snigirev, A ^b   Engemann, S ^a   Dosch, H ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

High energy X ray microbeam; Structure of interfaces; Surface physics; X ray diffraction

Indexed keywords

DIFFRACTION; INTERFACES (MATERIALS); SYNCHROTRON RADIATION; X RAY ANALYSIS;

HIGH-ENERGY MICROBEAMS;

HIGH ENERGY PHYSICS;

EID: 0037668989     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(03)00268-0     Document Type: Conference Paper

References (18)

1. J. Als-Nielsen, in: G.S. Brown, D.E. Moncton (Eds.), Handbook on Synchrotron Radiation Vol. 3, North-Holland, Amsterdam, 1991, pp. 473.
2. Dosch H. Critical Phenomena at Surfaces and Interfaces. Springer Tracts in Modern Physics. Vol. 126:1992;Springer, Berlin.
3. Robinson I.K. Phys. Rev. B. 33:1986;3830.
4. Robinson I.K., Tweet D.J. Rep. Prog. Phys. 55:1992;599.
5. Feidenhans'l R. Surf. Sci. Rep. 10(3):1989;1.
6. Vlieg E.et al. Surf. Sci. 210:1989;301.
7. I.K. Robinson, in: G. Brown, D.E. Moncton (Eds.), Handbook on Synchrotron Radiation Vol. 3, Elsevier Science Publisher, Amsterdam, 1991, pp. 221.
8. Dosch H.et al. Phys. Rev. Lett. 60:1988;2382.
9. Mailänder L.et al. Phys. Rev. Lett. 64:1990;2527.
10. Reichert H.et al. Phys. Rev. Lett. 74:1995;2006.
11. Nickel B.et al. Phys. Rev. Lett. 85:2000;134.
12. Ferrer S.et al. Phys. Rev. Lett. 77:1996;747.
13. Rieutord F.et al. Phys. Rev. B. 63:2001;125408.
14. Snigirev A., Kohn V., Snigireva I., Lengeler B. Nature. 384:1996;49.
15. C.G. Schroer, et al., in: A.K. Freund, T. Ishikawa, A.M. Khounsary, D.C. Mancini, A.G. Michette, S. Oestreich (Eds.), Advances in X-Ray Optics, Proc. SPIE 4145 (2001) 274.
16. Suortti P., Schulze C. J. Synchrotron Rad. 2:1995;6.
17. Suortti P.et al. Z. Phys. Chem. 215:2001;1419.
18. Reichert H.et al. Nature. 408:2000;839.