Scanning force microscopy of heavy-ion induced damage in lithium fluoride single-crystals

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 166, Issue , 2000, Pages 581-585

  Muller A ^a   Muller C ^a   Neumann, R ^a   Ohnesorge, F ^a  

^a GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH; CRYSTAL DEFECTS; GOLD; HEAVY IONS; ION BOMBARDMENT; LINEAR ACCELERATORS; MICROSCOPIC EXAMINATION; SINGLE CRYSTALS; SPECTROSCOPIC ANALYSIS; URANIUM; X RAY SCATTERING;

LITHIUM FLUORIDE; SCANNING FORCE MICROSCOPY; SMALL-ANGLE X-RAY SCATTERING;

LITHIUM COMPOUNDS;

EID: 0043287035     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)00791-0     Document Type: Article

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