-
1
-
-
3042511698
-
-
R. R. Henriquez, T. Ito, L. Sun, R. M. Crooks, Analyst 2004, 129, 478.
-
(2004)
Analyst
, vol.129
, pp. 478
-
-
Henriquez, R.R.1
Ito, T.2
Sun, L.3
Crooks, R.M.4
-
2
-
-
33644530477
-
-
US Patent 2 656 508
-
W. H. Coulter, US Patent 2 656 508, 1953.
-
(1953)
-
-
Coulter, W.H.1
-
3
-
-
4143057920
-
-
P. Chen, T. Mitsui, D. B. Farmer, J. Golovchenko, R. G. Gordon, D. Branton, Nano Lett. 2004, 4, 1333.
-
(2004)
Nano Lett.
, vol.4
, pp. 1333
-
-
Chen, P.1
Mitsui, T.2
Farmer, D.B.3
Golovchenko, J.4
Gordon, R.G.5
Branton, D.6
-
5
-
-
0037845299
-
-
Z. Siwy, P. Apel, D. Baur, D. D. Dobrev, Y. E. Korchev, R. Neumann, R. Spohr, C. Trautmann, K. Voss, Surf. Sci. 2003, 532, 1061.
-
(2003)
Surf. Sci.
, vol.532
, pp. 1061
-
-
Siwy, Z.1
Apel, P.2
Baur, D.3
Dobrev, D.D.4
Korchev, Y.E.5
Neumann, R.6
Spohr, R.7
Trautmann, C.8
Voss, K.9
-
6
-
-
1642528419
-
-
A. Mara, Z. Siwy, C. Trautmann, J. Wan, F. Kamme, Nano Lett. 2004, 4, 497.
-
(2004)
Nano Lett.
, vol.4
, pp. 497
-
-
Mara, A.1
Siwy, Z.2
Trautmann, C.3
Wan, J.4
Kamme, F.5
-
7
-
-
0348014625
-
-
C. C. Harrell, S. B. Lee, C. R. Martin, Anal. Chem. 2003, 75, 6861.
-
(2003)
Anal. Chem.
, vol.75
, pp. 6861
-
-
Harrell, C.C.1
Lee, S.B.2
Martin, C.R.3
-
8
-
-
9644273841
-
-
P. Chen, J. Gu, E. Brandin, Y. Kim, Q. Wang, D. Branton, Nano Lett. 2004, 4, 2293.
-
(2004)
Nano Lett.
, vol.4
, pp. 2293
-
-
Chen, P.1
Gu, J.2
Brandin, E.3
Kim, Y.4
Wang, Q.5
Branton, D.6
-
9
-
-
23144448498
-
-
A. J. Storm, C Storm, J. Chen, H. Zandbergen, J. Joanny, C. Dekker, Nano Lett. 2005, 5, 1193.
-
(2005)
Nano Lett.
, vol.5
, pp. 1193
-
-
Storm, A.J.1
Storm, C.2
Chen, J.3
Zandbergen, H.4
Joanny, J.5
Dekker, C.6
-
10
-
-
0033980542
-
-
A. Meller, L. Nivon, E. Brandin, J. Golovchenko, D. Branton, Proc. Nail. Acad. Sci. USA 2000, 97, 1079.
-
(2000)
Proc. Nail. Acad. Sci. USA
, vol.97
, pp. 1079
-
-
Meller, A.1
Nivon, L.2
Brandin, E.3
Golovchenko, J.4
Branton, D.5
-
12
-
-
0034930381
-
-
S. Howorka, S. Cheley, H. Bayley, Nat. Biotechnol. 2001, 19, 636.
-
(2001)
Nat. Biotechnol.
, vol.19
, pp. 636
-
-
Howorka, S.1
Cheley, S.2
Bayley, H.3
-
13
-
-
0035849885
-
-
J. Li, D. Stein, C. McMullan, D. Branton, M. J. Aziz, J. A. Golovchenko, Nature 2001, 412, 166.
-
(2001)
Nature
, vol.412
, pp. 166
-
-
Li, J.1
Stein, D.2
McMullan, C.3
Branton, D.4
Aziz, M.J.5
Golovchenko, J.A.6
-
14
-
-
10044276779
-
-
C. C. Harrell, P. Kohli, Z. Siwy, C. R. Martin, J. Am. Chem. Soc. 2004, 126, 15 646.
-
(2004)
J. Am. Chem. Soc.
, vol.126
, pp. 15646
-
-
Harrell, C.C.1
Kohli, P.2
Siwy, Z.3
Martin, C.R.4
-
15
-
-
17144391818
-
-
Z. Siwy, L. Troffin, P. Kohli, L. A. Baker, C. Trautmann, C. R. Martin, J. Am Chem. Soc. 2005, 127, 5000.
-
(2005)
J. Am Chem. Soc.
, vol.127
, pp. 5000
-
-
Siwy, Z.1
Troffin, L.2
Kohli, P.3
Baker, L.A.4
Trautmann, C.5
Martin, C.R.6
-
16
-
-
25844461753
-
-
E. A. Heins, Z. S. Siwy, L. A. Baker. C. R. Martin, Nano Lett. 2005, 5, 1824.
-
(2005)
Nano Lett.
, vol.5
, pp. 1824
-
-
Heins, E.A.1
Siwy, Z.S.2
Baker, L.A.3
Martin, C.R.4
-
17
-
-
0001100786
-
-
R. J. Young, J. Puretz, J. Vac. Sci. Technol. B: Microelectron. Nanometer Struct. - Process., Meas., Phenom. 1995, 13, 2576.
-
(1995)
J. Vac. Sci. Technol. B: Microelectron. Nanometer Struct. - Process., Meas., Phenom.
, vol.13
, pp. 2576
-
-
Young, R.J.1
Puretz, J.2
-
18
-
-
0242304620
-
-
K. Edinger, J. Melngailis, J. Orloff, J Vac. Sci. Technol. B: Microelectron. Nanometer Struct. -Process., Meas., Phenom. 1998, 16, 3311.
-
(1998)
J Vac. Sci. Technol. B: Microelectron. Nanometer Struct. - Process., Meas., Phenom.
, vol.16
, pp. 3311
-
-
Edinger, K.1
Melngailis, J.2
Orloff, J.3
-
19
-
-
84892224035
-
-
(Eds: L. A. Giannuzzi, F. A. Stevie), Springer, New York
-
Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice (Eds: L. A. Giannuzzi, F. A. Stevie), Springer, New York 2005.
-
(2005)
Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice
-
-
|