Stark effect on a geometry defined by a cake's slice

Microelectronics Journal

Volumn 36, Issue 3-6, 2005, Pages 596-598

  Reyes Esqueda, Jorge Alejandro ^a   Mendoza, Carlos I ^b   Del Castillo Mussot, Marcelo ^a   Vázquez, Gerardo J ^a  

^a UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

^b INSTITUTO DE INVESTIGACIONES EN MATERIALES   (Mexico)

Author keywords

Atomic force microscope; Nanocantilevers; NEMS; Quantum dots; Stark effect; Variational calculation

Indexed keywords

APPROXIMATION THEORY; ATOMIC FORCE MICROSCOPY; COMPUTATIONAL GEOMETRY; ELECTRIC FIELDS; GROUND STATE; SEMICONDUCTOR QUANTUM DOTS;

ATOMIC FORCE MICROSCOPE; NANOCANTILEVERS; NEMS; STARK EFFECT; VARIATIONAL CALCULATION;

HALL EFFECT;

EID: 33644526592     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mejo.2005.02.113     Document Type: Conference Paper

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