Bit error rate characteristics of write once read many super-resolution near field structure disk

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 45, Issue 2 B, 2006, Pages 1370-1373

  Kim, Jooho ^a   Hwang, Inoh ^a   Bae, Jaecheol ^a   Lee, Jinkyung ^a   Park, Hyunsoo ^a   Park, Insik ^a   Kikukawa, Takashi ^b   Fukuzawa, Narutoshi ^b   Kobayashi, Tatsuhiro ^b   Tominaga, Junji ^c  

^a SAMSUNG Electronics   (South Korea)

^b TDK CORPORATION   (Japan)

^c NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

bER characteristics; bER threshold; Super RENS; Write once

Indexed keywords

BIT ERROR RATE; LASER OPTICS; MAXIMUM LIKELIHOOD ESTIMATION; OPTICAL RESOLVING POWER; THIN FILMS;

CARRIER-TO-NOISE RATIO (CNR); SUPER-RENS; WRITE ONCE;

OPTICAL DISK STORAGE;

EID: 33644508924     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.45.1370     Document Type: Article

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