Random pattern signal characteristics of super-RENS disk in blue laser system

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5380, Issue , 2004, Pages 336-341

  Kim, Jooho ^a   Hwang, Inch ^a   Kim, Hyunki ^a   Yoon, Duseop ^a   Park, Hyunsoo ^a   Jung, Kiuhae ^a   Park, Insik ^a   Tominaga, Junji ^b  

^a SAMSUNG Electronics   (South Korea)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

50 GB Jitter Characteristics; 50 nm CNR; Readout Stability; Super RENS

Indexed keywords

LASER OPTICS; NANOSTRUCTURED MATERIALS; READOUT SYSTEMS; SIGNAL DETECTION; STABILITY; SURFACE PLASMON RESONANCE; TRANSMISSION ELECTRON MICROSCOPY;

50 GB JITTER CHARACTERISTICS; 50 NM CARRIER TO NOISE RATIO (CNR); READOUT STABILITY; SUPER-RESOLUTION NEAR FIELD STRUCTURE (RENS);

PATTERN RECOGNITION;

EID: 10044222267     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.557100     Document Type: Conference Paper

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