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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 44, Issue 5 B, 2005, Pages 3542-3546

Improvement of noise characteristics in super-resolution near-field structure disc

(7) Hwang, Inoh a Kim, Jooho a Bae, Jaecheol a Kim, Hyunki a Yoon, Duseop a Park, Insik a Shin, Dongho a

a SAMSUNG Electronics (South Korea)

Author keywords

Low frequency noise (LFN); Signal fluctuation; Super RENS; Te super resolution layer; W Si recording layer

Indexed keywords

CARRIER COMMUNICATION; JITTER; NATURAL FREQUENCIES; OPTICAL DEVICES; OPTICAL RECORDING; READOUT SYSTEMS; SIGNAL PROCESSING; SIGNAL TO NOISE RATIO; SPECTRUM ANALYZERS; TRANSMISSION ELECTRON MICROSCOPY;

LOW FREQUENCY NOISE (LFN); SIGNAL FLUCTUATION; SUPER-RENS; TE SUPER-RESOLUTION LAYER; W-SI RECORDING LAYERS;

SIGNAL NOISE MEASUREMENT;

EID: 23144437190 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/JJAP.44.3542 Document Type: Conference Paper

Times cited : (3)

References (12)

1
- 0033885694
- I. Ichimura, K. Kishima, K. Osato, K. Yamamoto, Y. Kuroda and K. Saito: Jpn. J. Appl. Phys. 39 (2000) 962.
- (2000) Jpn. J. Appl. Phys. , vol.39 , pp. 962
- Ichimura, I.¹ Kishima, K.² Osato, K.³ Yamamoto, K.⁴ Kuroda, Y.⁵ Saito, K.⁶

2
- 0242636070
- K. Mishima, H. Inoue, M. Aoshima, T. Komaki, H. Hirata and H. Utsunomiya: Proc. SPIE 5069 (2003) 90.
- (2003) Proc. SPIE , vol.5069 , pp. 90
- Mishima, K.¹ Inoue, H.² Aoshima, M.³ Komaki, T.⁴ Hirata, H.⁵ Utsunomiya, H.⁶

3
- 0036509221
- A. Shimizu, K. Sakanami, Y. Kadokawa, K. Takeuchi, H. Tashiro and K. Takatsu: Jpn. J. Appl. Phys. 41 (2002) 1745.
- (2002) Jpn. J. Appl. Phys. , vol.41 , pp. 1745
- Shimizu, A.¹ Sakanami, K.² Kadokawa, Y.³ Takeuchi, K.⁴ Tashiro, H.⁵ Takatsu, K.⁶

4
- 0033349523
- S. Kawata: Proc. IEEE 87 (1999) 2009.
- (1999) Proc. IEEE , vol.87 , pp. 2009
- Kawata, S.¹

5
- 14344262323
- L. Hesselink, S. Orlov and M. Bashaw: Proc. IEEE 92 (2004) 1231.
- (2004) Proc. IEEE , vol.92 , pp. 1231
- Hesselink, L.¹ Orlov, S.² Bashaw, M.³

6
- 0032511672
- J. Tominaga, T. Nakano and N. Atoda: Appl. Phys. Lett. 73 (1998) 2078.
- (1998) Appl. Phys. Lett. , vol.73 , pp. 2078
- Tominaga, J.¹ Nakano, T.² Atoda, N.³

7
- 0033889540
- H. Fuji, J. Tominaga, L. Men, T. Nakano, H. Katayama and N. Atoda: Jpn. J. Appl. Phys. 39 (2000) 980.
- (2000) Jpn. J. Appl. Phys. , vol.39 , pp. 980
- Fuji, H.¹ Tominaga, J.² Men, L.³ Nakano, T.⁴ Katayama, H.⁵ Atoda, N.⁶

8
- 0037449276
- T. Kikukawa, T. Nakano, T. Shima and J. Tominaga: Appl. Phys. Lett. 81 (2002) 4697.
- (2002) Appl. Phys. Lett. , vol.81 , pp. 4697
- Kikukawa, T.¹ Nakano, T.² Shima, T.³ Tominaga, J.⁴

9
- 23144449967
- J. Kim, I. Hwang, H. Kim, D. Yoon, H. Park, K. Jung and I. Park: Tech. Dig. Optical Data Storage Topical Meet. (2004) p. 273.
- (2004) Tech. Dig. Optical Data Storage Topical Meet , pp. 273
- Kim, J.¹ Hwang, I.² Kim, H.³ Yoon, D.⁴ Park, H.⁵ Jung, K.⁶ Park, I.⁷

10
- 0003602826
- Academic Press, Inc., San Diego
- M. Ohring: The Materials Science of Thin Films (Academic Press, Inc., San Diego, 1991) p. 390.
- (1991) The Materials Science of Thin Films , pp. 390
- Ohring, M.¹

11
- 0041379760
- T. Shima and J. Tominaga: Jpn. J. Appl. Phys. 42 (2003) 3479.
- (2003) Jpn. J. Appl. Phys. , vol.42 , pp. 3479
- Shima, T.¹ Tominaga, J.²

12
- 33748057601
- I. Hwang, J. Kim, H. Kim, I. Park and D. Shin: Asian-Pacific Data Storage Conf. Dig. (2004) p. 70.
- (2004) Asian-Pacific Data Storage Conf. Dig. , pp. 70
- Hwang, I.¹ Kim, J.² Kim, H.³ Park, I.⁴ Shin, D.⁵

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