Ferroelectric catastrophe: Beyond nanometre-scale optical resolution

Nanotechnology

Volumn 15, Issue 5, 2004, Pages 411-415

  Tominaga, Junji ^a   Shima, Takayuki ^a   Kuwahara, Masashi ^a   Fukaya, Toshio ^a   Kolobov, Alexander ^a   Nakano, Takashi ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLIZATION; LASERS; LENSES; MATHEMATICAL MODELS; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; OPTICAL DATA STORAGE; OPTICAL RESOLVING POWER; PHASE TRANSITIONS; QUANTUM THEORY; TEMPERATURE DISTRIBUTION; TENSILE STRESS; THIN FILMS; VELOCITY; X RAY ANALYSIS;

CATASTROPHE; CURIE TEMPERATURE; ULTRAHIGH DENSITY; WAVELENGTH;

FERROELECTRIC MATERIALS;

EID: 2642530247     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/15/5/001     Document Type: Article

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