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Volumn 29, Issue 1, 2005, Pages 107-122

Determination of multiple trace element compositions in thin (< 30 μm) layers of NIST SRM 614 and 616 using laser ablation-inductively coupled plasma-mass spectrometry (LA-ICP-MS)

Author keywords

LA ICP MS; NIST SRM 614 and 616; Thin sections; Trace elements

Indexed keywords


EID: 33444462267     PISSN: 16394488     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (127)

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