Ultra-trace element analysis of NIST SRM 616 and 614 using laser ablation microprobe-inductively coupled plasma-mass spectrometry (LAM-ICP-MS): A comparison with secondary ion mass spectrometry (SIMS)

Geostandards Newsletter

Volumn 21, Issue 2, 1997, Pages 191-203

  Horn, Ingo ^a,c   Hinton, Richard W ^b   Jackson, Simon E ^a   Longerich, Henry P ^a  

^a MEMORIAL UNIVERSITY OF NEWFOUNDLAND   (Canada)

^b UNIVERSITY OF EDINBURGH   (United Kingdom)

^c HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001651269     PISSN: 01505505     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1751-908X.1997.tb00670.x     Document Type: Article

References (28)

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