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Volumn 24, Issue 2, 2000, Pages 261-274

New ID-TIMS, ICP-MS and SIMS data on the trace element composition and homogeneity of NIST certified reference material SRM 610-611

Author keywords

Homogeneity; Microprobe techniques; MIST SRM 610 611; Reference materials; Trace elements

Indexed keywords


EID: 0001185316     PISSN: 01505505     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1751-908X.2000.tb00778.x     Document Type: Review
Times cited : (38)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.