Temperature dependence of anomalous currents in worst-bit cells in dynamic random-access memories

Journal of Applied Physics

Volumn 87, Issue 11, 2000, Pages 8064-8069

  Yamaguchi, Ken ^a  

^a HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3342985907     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.373498     Document Type: Article

References (21)

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