Numerical analysis of an anomalous current assisted by locally generated deep traps in pn junctions

IEEE Transactions on Electron Devices

Volumn 46, Issue 6, 1999, Pages 1159-1165

  Yamaguchi, Ken ^a   Teshima, Tatsuya ^a   Mizuta, Hiroshi ^a  

^a HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; NUMERICAL ANALYSIS;

ANOMALOUS CURRENT; DEVICE SIMULATION; SHOCKLEY-READ-HALL MODEL;

SEMICONDUCTOR JUNCTIONS;

EID: 0032674652     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.766878     Document Type: Article

References (17)