High-resolution photoemission study of the Si(111)/Au interface and its modification by a GaSe van der Waals termination layer

Applied Surface Science

Volumn 234, Issue 1-4, 2004, Pages 321-327

  Fritsche, R ^a   Jaeckel, B ^a   Klein, A ^a   Jaegermann, W ^a  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL GROWTH; GOLD; INTERFACES (MATERIALS); PHOTOEMISSION; SEMICONDUCTOR QUANTUM DOTS; SILICON; VAN DER WAALS FORCES; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTRONIC PASSIVATION; GASE; HIGH-RESOLUTION PHOTOEMISSION; SURFACE TERMINATION;

GALLIUM COMPOUNDS;

EID: 3342893135     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.05.038     Document Type: Conference Paper

References (23)

1. Koma A., Sunouchi K., Miyajima T. J. Vac. Sci. Technol. B. 3:1985;724.
2. W. Jaegermann, A. Klein, C. Pettenkofer, in: H.I. Hughes, H.P. Starnberg (Eds.), Electron Spectroscopies Applied to Low-Dimensional Materials, Kluwer Academic Publisher, Dordrecht, 2000.
3. Liu K.Y., Ueno K., Fujikawa Y., Saiki K., Koma A. Jpn. J. Appl. Phys. 32:1993;L434.
4. Jedrecy N., Pinchaux R., Eddrief M. Phys. Rev. B. 56:1997;9583.
5. Koëbel A., Zheng Y., Pétroff J.F., Boulliard J.C., Capelle B., Eddrief M. Phys. Rev. B. 56:1997;12296.
6. Meng S., Schroeder B.R., Olmstead M.A. Phys. Rev. B. 61:2000;7215.
7. Meng S., Schroeder B.R., Bostwick A., Olmstead M.A., Rotenberg E., Ohuchi F.S. Phys. Rev. B. 64:2001;235314.
8. Amokrane A., Sébenne C.A., Cricenti A., Ottaviani C., Proix F., Eddrief M. Appl. Surf. Sci. 123-124:1998;619.
9. Rudolph R., Pettenkofer C., Klein A., Jaegermann W. Appl. Surf. Sci. 166:2000;437.
10. Jaegermann W., Rudolph R., Klein A., Pettenkofer C. Thin Solid Films. 380:2000;276.
11. Rudolph R., Pettenkofer C., Klein A., Jaegermann W. Appl. Surf. Sci. 167:2000;122.
12. Fritsche R., Wisotzki E., Islam A.B.M.O., Thißen A., Klein A., Jaegermann W., Rudolph R., Tonti D., Pettenkofer C. Appl. Phys. Lett. 80:2002;1388.
13. Fritsche R., Wisotzki E., Thißen A., Islam A.B.M.O., Klein A., Jaegermann W., Rudolph R., Tonti D., Pettenkofer C. Surf. Sci. 515:2002;296.
14. Ueno K., Shirota H., Kawamura T., Shimada T., Saikib K., Koma A. Appl. Surf. Sci. 190:2002;485.
15. Ueno K., Saiki K., Koma A. Jpn. J. Appl. Phys., Part 1. 40:2001;1888.
16. Yeh J.J., Hwang J., Bertness K., Friedman D.J., Cao R., Lindau I. Phys. Rev. Lett. 70:1993;3768.
17. Molodtsov S.L., Laubschat C., Kaindl G., Shikin A.M., Adamchuk V.K. Phys. Rev. B. 44:1991;8850.
18. Pedersen K., Kristensen T.B., Pedersen T.G., Jensen T., Morgen P., Li Z.S., Hoffmann S.V. Surf. Sci. 523:2003;21.
19. Grupp C., Taleb-Ibrahimi A. Phys. Rev. B. 57:1998;6258.
20. Paggel J.J., Theis W., Horn K., Jung C., Hellwig C., Petersen H. Phys. Rev. B. 50:1994;18686 Le Lay G., Gothelid M., Grehk T.M., Bjorkquist M., Karlsson U.O., Aristov V.Y. Phys. Rev. B. 50:1994;14277.
21. Paggel J.J., Theis W., Horn K., Jung C., Hellwig C., Petersen H. Phys. Rev. B. 50:1994;18686 Le Lay G., Gothelid M., Grehk T.M., Bjorkquist M., Karlsson U.O., Aristov V.Y. Phys. Rev. B. 50:1994;14277.
22. Himpsel F.J., Hollinger G., Pollak R.A. Phys. Rev. B. 28:1983;7014.
23. ASM International Database, Binary Alloy Phase Diagrams, second ed.