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Volumn 106, Issue 4-5, 2006, Pages 389-397

Analysis of scanning probe microscope images using wavelets

Author keywords

Scanning probe microscopy

Indexed keywords

COMPUTER SIMULATION; DATA ACQUISITION; FOURIER TRANSFORMS; IMAGE ANALYSIS;

EID: 33344477345     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2005.11.006     Document Type: Article
Times cited : (22)

References (18)
  • 6
    • 33344471615 scopus 로고    scopus 로고
    • note
    • In this manuscript, we use the acronym SPM to loosely refer to all types of scanned probe microscopes. In reality, there is a large family of SPMs, often referred to as SxMs. Each is designed to detect the local variation in some quantity of interest. A few examples include a scanning tunneling microscope (STM), an electrostatic force microscope (EFM or scanning Kelvin probe), a magnetic force microscope (MFM), a photon scanning tunneling microscope (PSTM), a scanning electrochemical microscope (SECM), a scanning near-field optical microscope (SNOM), a scanning capacitance microscope (SCM), scanning tunneling spectroscopy (STS), and a frictional force microscope (FFM)
  • 18
    • 33344457915 scopus 로고    scopus 로고
    • note
    • WSxM is a freeware program available from Nanotec Electronica™. It provides a sophisticated suite of programs - fast Fourier transforms, versatile image processing capabilities, and quantitative feature size analysis - specifically designed for the analysis of SPM images


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.