Using wavelets to analyze AFM images of thin films: Surface micelles and supported lipid bilayers

Langmuir

Volumn 20, Issue 26, 2004, Pages 11557-11568

  Carmichael, Matt ^a   Vidu, Ruxandra ^a   Maksumov, Alisher ^a,b   Palazoglu, Ahmet ^a   Stroeve, Pieter ^a  

^a University of California   (United States)

^b OSIsoft Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DISCRETE WAVELET TRANSFORM; POWER SPECTRAL DENSITY (PSD); SHORT-TERM FOURIER TRANSFORM (STFT); WAVELET THEORY;

ATOMIC FORCE MICROSCOPY; FEATURE EXTRACTION; FOURIER TRANSFORMS; IMAGE ANALYSIS; LIPIDS; MICELLES; SELF ASSEMBLY; SURFACE PHENOMENA; SURFACE ROUGHNESS; WAVELET TRANSFORMS;

THIN FILMS;

ANTIMICROBIAL CATIONIC PEPTIDE; DODECYL SULFATE SODIUM; PROTEGRIN PG 1; PROTEGRIN PG-1; PROTEIN;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; IMAGE PROCESSING; LIPID BILAYER; MICELLE;

ANTIMICROBIAL CATIONIC PEPTIDES; IMAGE PROCESSING, COMPUTER-ASSISTED; LIPID BILAYERS; MICELLES; MICROSCOPY, ATOMIC FORCE; PROTEINS; SODIUM DODECYL SULFATE;

IMAGE ANALYSIS; LIPIDS; MICELLES; MONOLAYERS; SURFACES; THIN FILMS;

EID: 11144238906     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la048753c     Document Type: Article

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