Wavelet analysis of the surface morphologic of nanocrystalline TiO 2 thin films

Surface Science

Volumn 579, Issue 1, 2005, Pages 37-46

  Lin, Yuan ^a   Xiao, Xu Rui ^a   Li, Xue Ping ^a   Zhou, Xiao Wen ^a  

^a INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

Atomic force microscopy; Fractal surface; Semiconducting surfaces; Surface chemical reaction; Surface structure, morphology, roughness and topography; Titanium oxide

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL REACTIONS; FRACTALS; HYDROLYSIS; MICROSTRUCTURE; MORPHOLOGY; NANOSTRUCTURED MATERIALS; PHOTOCURRENTS; SURFACE STRUCTURE; SURFACES; TITANIUM OXIDES; WAVELET TRANSFORMS;

CHEMICAL TREATMENT; FRACTAL SURFACE; SEMICONDUCTING SURFACES; SURFACE CHEMICAL REACTION;

THIN FILMS;

EID: 14644414902     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2005.01.033     Document Type: Article

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