New and improved BIST diagnosis methods from combinatorial group testing theory

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 25, Issue 3, 2006, Pages 533-543

  Kahng, Andrew B ^a,b,c,d   Reda, Sherief ^a,b  

^a IEEE   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d MARCO   (United States)

Author keywords

Fault detection; Testing; VLSI BIST diagnosis

Indexed keywords

COMBINATORIAL GROUP TESTING (CGT); FAULT DETECTION; GROUP TESTING THEORY; VLSI BIST DIAGNOSIS;

ALGORITHMS; BENCHMARKING; COMPUTER SYSTEM RECOVERY; DIAGNOSIS; TESTING; VECTORS;

FORMAL LOGIC;

EID: 33244490351     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2005.854635     Document Type: Article

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