Salvaging test windows in BIST diagnostics

IEEE Transactions on Computers

Volumn 47, Issue 4, 1998, Pages 486-491

  Savir, Jacob ^a,b  

^a NEW JERSEY INSTITUTE OF TECHNOLOGY   (United States)

^b IEEE   (United States)

Author keywords

Autonomous MISR; BIST diagnostics; Error signature; LFSR; MISR; Signature analysis

Indexed keywords

COMPUTER ARCHITECTURE; ERROR ANALYSIS;

BUILT IN SELF TEST (BIST) DIAGNOSTICS; SIGNATURE ANALYSIS;

ELECTRIC NETWORK ANALYSIS;

EID: 0032046985     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/12.675718     Document Type: Article

References (10)

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10. C.E. Stroud and T.R. Damarla, "Improving the Efficiency of Error Identification via Signature Analysis," Proc. 1995 VLSI Test Symp., pp. 244-249, Apr. 1995.