Diagnosis for scan-based BIST: Reaching deep into the signatures

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2001, Pages 102-109

  Bayraktaroglu, Ismet ^a   Orailoglu, Alex ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EXACT ANALYSIS; PRECISE DIAGNOSTICS; SCAN CELLS; SCAN-BASED BIST; STATE INFORMATION;

EXHIBITIONS; SCANNING;

BUILT-IN SELF TEST;

EID: 0142164841     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2001.915008     Document Type: Conference Paper

References (9)

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