An interval-based diagnosis scheme for identifying failing vectors in a scan-BIST environment

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2002, Pages 382-386

  Liu, Chunsheng ^a   Chakrabarty, Krishnendu ^a   Goessel, Michael ^b  

^a Duke University   (United States)

^b UNIVERSITY OF POTSDAM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL RESULTS; BENCHMARK CIRCUIT; CIRCUIT UNDER TEST; INTERVALS OF TEST VECTORS; LOWER BOUNDS; MULTIPLE TEST; MULTIPLE-INPUT SIGNATURE REGISTERS; PRUNING PROCEDURES;

EXHIBITIONS; VECTORS;

BUILT-IN SELF TEST;

EID: 17044407766     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2002.998302     Document Type: Conference Paper

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