Variable-angle ellipsometry and molecular orientation in monoclinic organic semiconductors

Applied Physics Letters

Volumn 88, Issue 7, 2006, Pages

  Tavazzi, S ^a   Campione, M ^a  

^a INFM   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

OLIGOTHIOPHENE CRYSTALS; POLYMORPHS; PREPARATION CONDITIONS; VARIABLE ANGLE ELLIPSOMETRY;

ANISOTROPY; CRYSTALLOGRAPHY; CRYSTALS; ELLIPSOMETRY; MOLECULAR ORIENTATION; PHASE TRANSITIONS; THIN FILMS;

SEMICONDUCTING ORGANIC COMPOUNDS;

EID: 32944468543     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2173254     Document Type: Article

References (25)

1. Handbook of Oligo- and Poly-Thiophenes, edited by, D. Fichou, (Wiley-VCH, Weinheim, 1999).
2. D. Y. Zang, F. F. So, and S. R. Forrest, Appl. Phys. Lett. 59, 823 (1991).
3. T. J. Prosa, M. J. Winokur, J. Moulton, P. Smith, and A. J. Heeger, Macromolecules 25, 4364 (1992).
4. R. W. Gymer, R. H. Friend, H. Ahmed, P. L. Burn, A. M. Kraft, and A. B. Holmes, Synth. Met. 55, 3683 (1993).
5. H. J. Fell, E. J. Samuelsen, J. Als-Nielsen, G. Grubel, and J. Mardalen, Solid State Commun. 94, 843 (1995).
6. K. E. Aasmundtveit, E. J. Samuelsen, M. Guldstein, C. Steinsland, O. Flornes, C. Fagermo, T. M. Seeberg, L. A. A. Pettersson, O. Inganas, R. Feidenhans'l, and S. Ferrer, Macromolecules 33, 3120 (2000).
7. M. Tammer and P. Monkman, Adv. Mater. (Weinheim, Ger.) 14, 210 (2002).
8. C. M. Ramsdale and N. C. Greenham, Adv. Mater. (Weinheim, Ger.) 14, 212 (2002).
9. U. Zhokhavets, R. Goldhahn, G. Gobsch, and W. Schliefke, Synth. Met. 138, 491 (2003).
10. M. Friedrich, T. Wagner, G. Salvan, S. Park, T. U. Kampen, and D. R. T. Zahn, Appl. Phys. A: Mater. Sci. Process.. 75, 501 (2002).
11. M. Friedrich, G. Gavrila, C. Himcinschi, T. U. Kampen, A. Yu Kobitski, H. Ḿndez, G. Salvan, I. Cerrilló, J. Ḿndez, N. Nicoara, A. M. Baró, and D. R. T. Zahn, J. Phys.: Condens. Matter 15, S2718 (2003).
12. U. Zhokhavets, G. Gobsch, H. Hoppe, and N. S. Sariciftci, Synth. Met. 143, 113 (2004).
13. B. P. Lyons and A. P. Monkman, J. Appl. Phys. 96, 4735 (2004).
14. H. W. Lin, C. L. Lin, H. H. Chang, Y. T. Lin, C. C. Wu, Y. M. Chen, R. T. Chen, Y. Y. Chien, and K. T. Wong, J. Appl. Phys. 95, 881 (2004).
15. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1997).
16. P. Lang, P. Kouki, J. P. Roger, J. C. Martinez, G. Horowitz, and F. Garnier, Synth. Met. 101, 536 (1999).
17. S. Trabattoni, S. Laera, R. Mena, A. Papagni, and A. Sassella, J. Mater. Chem. 14, 171 (2004).
18. M. Campione, R. Ruggerone, S. Tavazzi, and M. Moret, J. Mater. Chem. 15, 2437 (2005).
19. T. Siegrist, C. Kloc, R. A. Laudise, H. E. Katz, and R. C. Haddon, Adv. Mater. (Weinheim, Ger.) 10, 379 (1998).
20. M. Campione (unpublished).
21. S. Destri, M. Mascherpa, and W. Porzio, Adv. Mater. (Weinheim, Ger.) 5, 43 (1993).
22. R. A. Laudise, P. M. Bridenbaugh, T. Siegrist, R. M. Fleming, H. E. Katz, and A. J. Lovinger, J. Cryst. Growth 152, 241 (1995).
23. M. Laicini, P. Spearman, S. Tavazzi, and A. Borghesi, Phys. Rev. B 71, 045212 (2005).
24. M. Laicini, P. Spearman, S. Tavazzi, L. Raimondo, L. Miozzo, M. Moret, and A. Borghesi, J. Lumin. 112, 316 (2005).
25. D. W. Berreman, J. Opt. Soc. Am. 62, 502 (1972).