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Synthetic Metals

Volumn 101, Issue 1, 1999, Pages 536-537

Optical characterisation of 6T and 4T single crystals by ellipsometry; anisotropy and crystalline structure

(6) Lang, P a Kouki, F a Roger, J P b,d Martinez, J C c Horowitz, G a Gamier, F a

a CNRS (France)

b PSL RESEARCH UNIVERSITY (France)

c SOPRA (France)

d UNIVERSIDAD COMPLUTENSE DE MADRID (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; COMPUTER SIMULATION; CRYSTAL GROWTH; CRYSTAL STRUCTURE; ELECTRON ENERGY LEVELS; ELLIPSOMETRY; OPTICAL PROPERTIES; SINGLE CRYSTALS; SUBLIMATION; ANISOTROPY; ELECTROMAGNETIC DISPERSION; LIGHT ABSORPTION; OLIGOMERS; OPTICAL KERR EFFECT; PLASTIC FILMS; SULFUR COMPOUNDS;

ABSORPTION ANISOTROPY; EFFECTIVE OPTICAL INDEXES; OLIGOTHIOPHENE; SEXITHIOPHENE;

ORGANIC POLYMERS; CONDUCTIVE PLASTICS;

OLIGOTHIOPHENES; OPTICAL INDICES;

EID: 0032590804 PISSN: 03796779 EISSN: None Source Type: None
DOI: 10.1016/S0379-6779(98)00527-X Document Type: Article

Times cited : (8)

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