The effects of ZnO films on surface acoustic wave properties of modified lead titanate ceramic substrates

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 52, Issue 12, 2005, Pages 2308-2313

  Chu, Sheng Yuan ^a   Chen, Te Yi ^a   Water, W ^a  

^a NONE

Author keywords

Atomic force microscopy; Crystalline structures; Polycrystal zinc oxide films; rf magnetron sputtering technique; Scanning electron microscopy; SEM; Strontium modified lead titanate ceramic substrates; Surface acoustic wave properties; X ray diffraction; XRD

Indexed keywords

PHASE VELOCITY; POLYCRYSTAL ZINC OXIDE FILMS; TEMPERATURE COEFFICIENTS;

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; CRYSTALLINE MATERIALS; LEAD COMPOUNDS; MAGNETRON SPUTTERING; PRESSURE EFFECTS; SCANNING ELECTRON MICROSCOPY; THIN FILMS; TRANSDUCERS; ZINC OXIDE;

CERAMIC MATERIALS;

EID: 32844469621     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/TUFFC.2005.1563275     Document Type: Article

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