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Volumn 47, Issue 2, 2004, Pages 227-232

Micro/nanotribological and mechanical studies of TiN thin-film for MEMS applications

Author keywords

Micro nanomechanical and tribological properties; Microelectromechanical systems (MEMS); Single crystal silicon; TiN thin films

Indexed keywords

FRICTION; HARDNESS; SILICON; SINGLE CRYSTALS; THIN FILMS; TITANIUM NITRIDE; TRIBOLOGY; WEAR RESISTANCE; MICROELECTROMECHANICAL DEVICES; NANOTECHNOLOGY;

EID: 3242763004     PISSN: 10402004     EISSN: None     Source Type: Journal    
DOI: 10.1080/05698190490439076     Document Type: Article
Times cited : (18)

References (14)
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  • 2
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    • Sundararajan, S.1    Bhushan, B.2
  • 3
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    • Li, X. and Bhushan, B. (1999), "Evaluation of Fracture Toughness of Ultra-Thin Hard Amorphous Carbon Coatings Deposited by Different Deposition Technique," Thin Solid Films, 355-356, pp 330-336.
    • (1999) Thin Solid Films , vol.355-356 , pp. 330-336
    • Li, X.1    Bhushan, B.2
  • 4
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  • 5
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    • Krauss, A. R., Auciello, O., Gruen, D. M., et al. (2001), "Ultrananocrystalline Diamond Thin Films for MEMS and Moving Mechanical Assembly Devices," Diam. Relat. Mater., 10, pp 1952-1961.
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  • 8
    • 3242747114 scopus 로고    scopus 로고
    • Thin-film preparation with pulse-laser-arc
    • Zhou Ming, Shao Tianmin, et al., (2002), "Thin-Film Preparation with Pulse-Laser-Arc," Lubr. Eng., 2, pp 41-43.
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    • Ming, Z.1    Tianmin, S.2
  • 9
    • 0034263112 scopus 로고    scopus 로고
    • Investigations of nano- and macro-wear of magnetic tape head materials
    • Tan, S., et al. (2000), "Investigations of Nano- and Macro-Wear of Magnetic Tape Head Materials," Tribol. Int., 33, pp 673-681.
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    • Tan, S.1
  • 10
    • 0030282664 scopus 로고    scopus 로고
    • Microtribological studies of doped single-crystal silicon and polysilicon films for MEMS devices
    • Bhushan, B. and Koinkar, V. N. (1996), "Microtribological Studies of Doped Single-Crystal Silicon and Polysilicon Films for MEMS Devices," Sens. Actuators, A57, pp 91-102.
    • (1996) Sens. Actuators , vol.A57 , pp. 91-102
    • Bhushan, B.1    Koinkar, V.N.2
  • 11
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  • 12
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    • Bhushan, B. and Goldade, A. V (2000), "Measurements and Analysis of Surface Potential Change During Wear of Single-Crystal Silicon (100) at Ultralow Loads Using Kelvin Probe Microscopy," Appl. Surf. Sci., 157, pp 373-381.
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  • 13
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  • 14
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    • Souty, E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.