메뉴 건너뛰기




Volumn 113, Issue 3, 2004, Pages 338-343

Low-frequency noise in non-homogeneously doped semiconductor

Author keywords

Acoustic phonons; Built in electric field; Low frequency noise

Indexed keywords

ELECTRIC FIELD EFFECTS; ELECTRONS; FUNCTIONS; MAGNETIC FIELD EFFECTS; PHONONS; SEMICONDUCTOR DOPING; SENSORS; VECTORS;

EID: 3242684133     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sna.2004.04.035     Document Type: Article
Times cited : (13)

References (34)
  • 1
    • 0000088664 scopus 로고    scopus 로고
    • On the statistical analysis of noise in chemical sensors and its application for sensing
    • Smulko J., Granquist C.-G., Kish B. On the statistical analysis of noise in chemical sensors and its application for sensing. Fluctuation and Noise Letters. 1(3):2001;L147-L153.
    • (2001) Fluctuation and Noise Letters , vol.1 , Issue.3 , pp. 147-L153
    • Smulko, J.1    Granquist, C.-G.2    Kish, B.3
  • 2
    • 0034294254 scopus 로고    scopus 로고
    • Analysis of vapors and foods by means of an electric noise based on a sol-gel metal oxide sensors array
    • Capone S., Siciliano P., Quaranta F., Rella R., Epifani M., Vasanelli L. Analysis of vapors and foods by means of an electric noise based on a sol-gel metal oxide sensors array. Sens. Actuators, B. 69:2000;230-235.
    • (2000) Sens. Actuators, B , vol.69 , pp. 230-235
    • Capone, S.1    Siciliano, P.2    Quaranta, F.3    Rella, R.4    Epifani, M.5    Vasanelli, L.6
  • 3
    • 0034322333 scopus 로고    scopus 로고
    • Extracting information from the noise spectra of chemical sensors: Electronic noise and tongue by one sensor
    • Kish L.B., Vajtai R., Granqvist C.G. Extracting information from the noise spectra of chemical sensors: Electronic noise and tongue by one sensor. Sens. Actuators B. 71:2000;55-59.
    • (2000) Sens. Actuators B , vol.71 , pp. 55-59
    • Kish, L.B.1    Vajtai, R.2    Granqvist, C.G.3
  • 4
    • 3242660329 scopus 로고    scopus 로고
    • Detection of Chemicals based on resistance fluctuation spectroscopy. Swedish patent No: 98-030-190. Publicaton No.: 513148
    • L.B. Kish, C.G. Granqvist, J. Soderlund, Detection of chemicals based on resistance fluctuation spectroscopy. Swedish patent No: 98-030-190. Publicaton No.: 513148.
    • Kish, L.B.1    Granqvist, C.G.2    Soderlund, J.3
  • 5
    • 0042934435 scopus 로고    scopus 로고
    • Noise and scanning by local illumination as reliability estimation for silicon solar cells
    • Chabola Z., Ibrahim A. Noise and scanning by local illumination as reliability estimation for silicon solar cells. Fluctuation and Noise Letters. 1:2001;L21-L26.
    • (2001) Fluctuation and Noise Letters , vol.1 , pp. 21-L26
    • Chabola, Z.1    Ibrahim, A.2
  • 7
    • 0028550908 scopus 로고
    • Charge Transport and device Parameters from Noise Measurments
    • Bosman G. Charge Transport and device Parameters from Noise Measurments. IEEE Trans. on Elect. Dev. 41:1994;2198-2204.
    • (1994) IEEE Trans. on Elect. Dev. , vol.41 , pp. 2198-2204
    • Bosman, G.1
  • 8
    • 77956987431 scopus 로고
    • Electrical noise as a measure of reliability in electronic devices
    • Jones K. Electrical noise as a measure of reliability in electronic devices. Adv. Electron. Electron Phy. 67:1994;201-257.
    • (1994) Adv. Electron. Electron Phy. , vol.67 , pp. 201-257
    • Jones, K.1
  • 10
    • 0034515123 scopus 로고    scopus 로고
    • Sensing properties of palladium-gate MOS (Pd-MOS) hydrogen sensor-based on plasma grown silicon dioxide
    • Dwivedi D., Dwivedi R., Srivastava S.K. Sensing properties of palladium-gate MOS (Pd-MOS) hydrogen sensor-based on plasma grown silicon dioxide. Sens. Actuators B. 71:2000;161-168.
    • (2000) Sens. Actuators B , vol.71 , pp. 161-168
    • Dwivedi, D.1    Dwivedi, R.2    Srivastava, S.K.3
  • 12
    • 36549102596 scopus 로고
    • A unified theory of noise in nondegenerate semiconductors
    • Min H.S. A unified theory of noise in nondegenerate semiconductors. J. Appl. Phys. 61:1987;4549-4560.
    • (1987) J. Appl. Phys. , vol.61 , pp. 4549-4560
    • Min, H.S.1
  • 14
    • 0001525683 scopus 로고    scopus 로고
    • Semiconductor noise in the framework of semiclassical transport
    • Korman C.E., Mayergoyz I.D. Semiconductor noise in the framework of semiclassical transport. Phys. Rev. B. 54:1996;17620-17627.
    • (1996) Phys. Rev. B , vol.54 , pp. 17620-17627
    • Korman, C.E.1    Mayergoyz, I.D.2
  • 20
    • 3242680100 scopus 로고    scopus 로고
    • Built-in electric field as an additional source of noise in semiconductors, noise and information in nano-electronics, sensors, and standards
    • paper no. 5115-49
    • H.V. Asriyan, F.V. Gasparyan, V.M. Aroutiounian, Built-in Electric Field as an Additional Source of Noise in Semiconductors, Noise and Information in Nano-electronics, Sensors, and Standards part of SPIE First International Symposium on Fluctuations and Noise, vol 5115, paper no. 5115-49.
    • SPIE First International Symposium on Fluctuations and Noise , vol.5115
    • Asriyan, H.V.1    Gasparyan, F.V.2    Aroutiounian, V.M.3
  • 24
    • 0042934435 scopus 로고    scopus 로고
    • Noise and scanning by local illumination as reliability estimation for silicon solar cells
    • Chabola Z., Ibrahim A. Noise and scanning by local illumination as reliability estimation for silicon solar cells. Fluctuation and Noise Letters. 1:2001;L21-L26.
    • (2001) Fluctuation and Noise Letters , vol.1 , pp. 21-L26
    • Chabola, Z.1    Ibrahim, A.2
  • 25
    • 0032654587 scopus 로고    scopus 로고
    • Low-frequency noise in electrically stressed n-MOSFETs
    • Ren L., Okhonin S., Ilegems M. Low-frequency noise in electrically stressed n-MOSFETs. Solid-State Electron. 43:1999;849-859.
    • (1999) Solid-state Electron. , vol.43 , pp. 849-859
    • Ren, L.1    Okhonin, S.2    Ilegems, M.3
  • 26
    • 0032649429 scopus 로고    scopus 로고
    • Reliability aspects of the low-noise behavior of submicron CMOS technology
    • Simoen E., Claeys C. Reliability aspects of the low-noise behavior of submicron CMOS technology. Semicond. Sci. Technol. 14:1999;R61-R71.
    • (1999) Semicond. Sci. Technol. , vol.14 , pp. 61-R71
    • Simoen, E.1    Claeys, C.2
  • 27
    • 0024639899 scopus 로고
    • Volume and temperature dependence of the 1/f noise parameter in Si
    • Clevers R.H.M. Volume and temperature dependence of the 1/f noise parameter in Si. Physica B. 154:1989;214-224.
    • (1989) Physica B , vol.154 , pp. 214-224
    • Clevers, R.H.M.1
  • 28
    • 0001498069 scopus 로고    scopus 로고
    • Spectrum analyzer with noise reduction by cross-correlation technique on two channels
    • Sampierto M., Fasoli L., Ferrari G. Spectrum analyzer with noise reduction by cross-correlation technique on two channels. Rev. Sci. Instrum. 70:1999;2520-2525.
    • (1999) Rev. Sci. Instrum. , vol.70 , pp. 2520-2525
    • Sampierto, M.1    Fasoli, L.2    Ferrari, G.3
  • 29
    • 0001595369 scopus 로고    scopus 로고
    • Current noise spectra in CdTe semiconductor diodes
    • Sampierto M., Ferrari G., Bertuccio G. Current noise spectra in CdTe semiconductor diodes. J. Appl. Phys. 80(10):2000;7583-7585.
    • (2000) J. Appl. Phys. , vol.80 , Issue.10 , pp. 7583-7585
    • Sampierto, M.1    Ferrari, G.2    Bertuccio, G.3
  • 30
    • 0042757870 scopus 로고
    • Microelectronic technologies - The main way for obtaining of chemical sensors
    • Aroutiounian V.M. Microelectronic technologies - the main way for obtaining of chemical sensors. Sov. Microelectronics. 20(4):1991;337-355.
    • (1991) Sov. Microelectronics , vol.20 , Issue.4 , pp. 337-355
    • Aroutiounian, V.M.1
  • 31
    • 0038110851 scopus 로고    scopus 로고
    • Smoke sensor with overcoming of humidity cross sensitivity
    • Adamian A.Z., Adamian Z.N., Aroutiounian V.M. Smoke sensor with overcoming of humidity cross sensitivity. Sens Actuators B. 93:2003;416-421.
    • (2003) Sens Actuators B , vol.93 , pp. 416-421
    • Adamian, A.Z.1    Adamian, Z.N.2    Aroutiounian, V.M.3
  • 33
    • 0034249111 scopus 로고    scopus 로고
    • The screening of a potential of charged centers by quasi-two-dimensional electrons in transverse electric field
    • Aghababyan G.S., Aroutiounian V.M., Mikaelyan L.V., Petrosyan S.G. The screening of a potential of charged centers by quasi-two-dimensional electrons in transverse electric field. Appl. Surf. Sci. 162-163:2000;346-353.
    • (2000) Appl. Surf. Sci. , vol.162-163 , pp. 346-353
    • Aghababyan, G.S.1    Aroutiounian, V.M.2    Mikaelyan, L.V.3    Petrosyan, S.G.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.