SCOPUS 정보 검색 플랫폼

Volumn 5921, Issue , 2005, Pages 1-8

Metrology for the development of high-energy x-ray optics

Author keywords

Electroform nickel replication; Figure measurements; X ray optics; X ray optics metrology

Indexed keywords

ELECTROFORM-NICKEL REPLICATION; X-RAY OPTICS METROLOGY;

ELECTROFORMING; ITERATIVE METHODS; NICKEL; OPTICAL RESOLVING POWER; OPTICAL TELESCOPES;

X RAY OPTICS;

EID: 31844455687 PISSN: 0277786X EISSN: None Source Type: Conference Proceeding
DOI: 10.1117/12.621170 Document Type: Conference Paper

Times cited : (7)

References (10)

1
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- First images from HERO, a hard x-ray focusing telescope
- B.D. Ramsey, C. D. Alexander, J. A. Apple, C. M. Benson, K L. Dietz, R F. Eisner, D. E. Engelhaupt, K. K. Ghosh, J. J. Kolodziejczak, S. L. O'Dell, C. O. Speegle, D. A. Swartz, M. C. Weisskopf, "First images from HERO, a hard x-ray focusing telescope, "The Astrophysical Journal, v. 568, No. 1, 1-4, 2002
- (2002) The Astrophysical Journal , vol.568 , Issue.1 , pp. 1-4
- Ramsey, B.D.¹ Alexander, C.D.² Apple, J.A.³ Benson, C.M.⁴ Dietz, K.L.⁵ Eisner, R.F.⁶ Engelhaupt, D.E.⁷ Ghosh, K.K.⁸ Kolodziejczak, J.J.⁹ O'Dell, S.L.¹⁰ Speegle, C.O.¹¹ Swartz, D.A.¹² Weisskopf, M.C.¹³

2
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- Performance of a gas scintillation proportional counter array for a High Energy X-ray Observatory
- M. Gubarev, B. Ramsey, J. Apple, "Performance of a gas scintillation proportional counter array for a High Energy X-ray Observatory," Proc. SPIE, 5501, 339-345, 2004
- (2004) Proc. SPIE , vol.5501 , pp. 339-345
- Gubarev, M.¹ Ramsey, B.² Apple, J.³

4
- 0020780345
- Interferometry of wavefronts reflected off conical surfaces
- K. von Bieren, "Interferometry of wavefronts reflected off conical surfaces," Appl. Opt. 22, 2109, 1983.
- (1983) Appl. Opt. , vol.22 , pp. 2109
- Von Bieren, K.¹

5
- 0010715288
- Measurement of x-ray telescope mirrors using a vertical scanning long trace profiler
- H. Z. Li, X.J. Li, M.W. Grindel, P. Z. Takacs, "Measurement of x-ray telescope mirrors using a vertical scanning long trace profiler," Opt. Eng. 35(2), 330-338, 1996.
- (1996) Opt. Eng. , vol.35 , Issue.2 , pp. 330-338
- Li, H.Z.¹ Li, X.J.² Grindel, M.W.³ Takacs, P.Z.⁴

6
- 0010755068
- Vertical scanning long trace profiler: A tool for metrology of x-ray mirrors
- H. Z. Li, P. Z. Takacs, T. Oversluizen, "Vertical scanning long trace profiler: a tool for metrology of x-ray mirrors," Proc. SPIE, 3152, 180-187, 1997.
- (1997) Proc. SPIE , vol.3152 , pp. 180-187
- Li, H.Z.¹ Takacs, P.Z.² Oversluizen, T.³

7
- 0035761207
- Calibration of a vertical-scan long trace profiler at MSFC
- M. Gubarev, T. Kester, P. Z. Takacs, "Calibration of a vertical-scan long trace profiler at MSFC", Proc. SPIE, 4451, 333-339, 2001
- (2001) Proc. SPIE , vol.4451 , pp. 333-339
- Gubarev, M.¹ Kester, T.² Takacs, P.Z.³

8
- 1842638731
- Figure measurements of high-energy-X-ray replicated optics
- M. Gubarev, B. Ramsey, T. Kester, C. Speegle, D. Engelhaupt, G. Martin, "Figure Measurements of High-Energy-X-Ray Replicated Optics, Proc. SPIE, 5168, 227-234, 2003.
- (2003) Proc. SPIE , vol.5168 , pp. 227-234
- Gubarev, M.¹ Ramsey, B.² Kester, T.³ Speegle, C.⁴ Engelhaupt, D.⁵ Martin, G.⁶

9
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- X-ray Imager (SXI) optical performance analysis
- Smithers, Martin E., Zissa, David E. Solar "X-ray Imager (SXI) optical performance analysis.", Proc. SPIE 2805, pp. 115-120 (1996).
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- Smithers, M.E.¹ Zissa, D.E.S.²

10
- 31844445367
- OTA-E-351, Washington, D.C. U.S. Government Printing Office
- U.S. Congress, Office of Technology Assessment, "Advanced Materials by Design", OTA-E-351, Washington, D.C. U.S. Government Printing Office, p.101-104, 1998
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.