Figure Measurements of High-Energy-X-Ray Replicated Optics

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5168, Issue , 2004, Pages 227-234

  Gubarev, Mikhail ^a   Ramsey, Brian ^b   Kester, Thomas ^b   Speegle, Chet ^d   Engelhaupt, Darell ^c   Martin, Greg ^e  

^a UNIVERSITIES SPACE RESEARCH ASSOCIATION   (United States)

^b NASA MARSHALL SPACE FLIGHT CENTER   (United States)

^c UNIVERSITY OF ALABAMA IN HUNTSVILLE   (United States)

^d NASA HEADQUARTERS   (United States)

^e ERC Inc   (United States)

Author keywords

Electroform nickel replication; Figure measurements; Long trace profilometer; X ray optics instrumentation

Indexed keywords

ASTRONOMY; ELECTROFORMING; LASER BEAM EFFECTS; MIRRORS; PROFILOMETRY; SURFACE ROUGHNESS; ZINC COMPOUNDS;

ELECTROFORM NICKEL REPLICATION; FIGURE MEASUREMENTS; LONG TRACE PROFILOMETER; X RAY OPTICS INSTRUMENTATION;

X RAY OPTICS;

EID: 1842638731     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.508336     Document Type: Conference Paper

References (7)

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