X-ray beam metrology and X-ray optic alignment by Hartmann wavefront sensing

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5921, Issue , 2005, Pages 1-10

  Mercère, Pascal ^a   Bucourt, Samuel ^b   Cauchon, Gilles ^a   Douillet, Denis ^c   Dovillaire, Guillaume ^b   Goldberg, Kenneth A ^d   Idir, Mourad ^a   Levecq, Xavier ^b   Moreno, Thierry ^a   Naulleau, Patrick P ^d   Rekawa, Senajith ^d   Zeitoun, Philippe ^c  

^a SYNCHROTRON SOLEIL   (France)

^b Imagine Optic   (France)

^c LABORATOIRE D OPTIQUE APPLIQUÉE   (France)

^d LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

Active and adaptive optic; Hartmann and Shack Hartmann techniques; Synchrotron radiation; Wave front measurement; X UV and hard X rays

Indexed keywords

DISTORTION (WAVES); GENETIC ALGORITHMS; LIGHT SOURCES; OPTICAL SENSORS; SYNCHROTRON RADIATION; WAVEFRONTS;

ADVANCED LIGHT SOURCE (ALS); HARTMANN AND SHACK-HARTMANN TECHNIQUES;

X RAY OPTICS;

EID: 31844448019     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.622799     Document Type: Conference Paper

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