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Volumn 44, Issue 50-52, 2005, Pages
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Fabrication of nanoparticle composite porous films having ultralow dielectric constant
b
ASM Japan KK
(Japan)
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Author keywords
Dielectric constant; ILD; Low k; LSI; Nanoparticles; Plasma CVD; Porous film
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Indexed keywords
ADHESIVES;
COMPOSITE MATERIALS;
LSI CIRCUITS;
PERMITTIVITY;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
POROUS MATERIALS;
SUBSTRATES;
ILD;
LOW-K;
LSI;
NANOPARTICLES;
PLASMA CVD;
POROUS FILMS;
NANOSTRUCTURED MATERIALS;
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EID: 31844432173
PISSN: 00214922
EISSN: 13474065
Source Type: Journal
DOI: 10.1143/JJAP.44.L1509 Document Type: Article |
Times cited : (43)
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References (21)
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