Photodegradation of poly(ether sulphone) Part 2. Wavelength and atmosphere dependence

Surface and Interface Analysis

Volumn 36, Issue 12, 2004, Pages 1542-1549

  Norrman, K ^a   Krebs, F C ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

Chain scission; Cross linking; Isotope labelling; Membrane; Photodegradation; Photooxidation; Poly(ether sulphone); ToF SIMS; Wavelength; XPS

Indexed keywords

CROSSLINKING; DATA ACQUISITION; MASS SPECTROMETRY; MEMBRANES; PHOTOOXIDATION; ULTRAVIOLET RADIATION; X RAY PHOTOELECTRON SPECTROSCOPY;

CHAIN SCISSION; ISOTOPE LABELLING; POLY(ETHER SULPHONE); WAVELENGTH;

PHOTODEGRADATION;

EID: 10844269809     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1981     Document Type: Article

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