Drain current overshoot transient in polycrystalline silicon transistors: The effect of hole generation mechanism

Journal of Applied Physics

Volumn 99, Issue 2, 2006, Pages

  Exarchos, M ^a   Papaioannou, G J ^a   Kouvatsos, D N ^b   Voutsas, A T ^c  

^a UNIVERSITY OF ATHENS   (Greece)

^b INSTITUTE OF NANOSCIENCE AND NANOTECHNOLOGY   (Greece)

^c SHARP LABORATORIES OF AMERICA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DOMAINS; SWITCH-ON TRANSIENTS;

CRYSTALLIZATION; EXCIMER LASERS; LIGHTING; POLYSILICON; TEMPERATURE DISTRIBUTION; THIN FILM TRANSISTORS;

ELECTRIC CURRENT CONTROL;

EID: 31744446392     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2158138     Document Type: Article

References (21)

1. Simon W.-B. Tam, P. Migliorato, O. K. B. Lui, and M. J. Quinn, IEEE Trans. Electron Devices 46, 134 (1994).
2. N. Bavidge, M. Borero, P. Migiorato, and T. Shimoda, Appl. Phys. Lett. 77, 3836 (2000).
3. H. Ikeda, Jpn. J. Appl. Phys., Part 1 43, 477 (2004).
4. G. J. Papaioannou, M. Exarchos, D. Kouvatsos, and A. Voutsas, Thin Solid Films 487, 247 (2005).
5. A. T. Voutsas, A. Limanov, and J. S. Im, J. Appl. Phys. 94, 7445 (2003).
6. A. T. Voutsas, IEEE Trans. Electron Devices 50, 1494 (2003).
7. J. R. Ayres, J. Appl. Phys. 74, 1787 (1993).
8. G. A. Armstrong, J. R. Ayres, and S. D. Brotherton, Solid-State Electron. 41, 835 (1997).
9. D. K. Schroder, Semiconductor Material and Device Characterization (Wiley, New York, 1998).
10. D. K. Schroder, IEEE Trans. Electron Devices 44, 160 (1997).
11. D. K. Schroder, B. D. Choi, S. G. Kang, W. Ohashi, K. Kitahara, G. Opposits, T. Pavelka, and J. Benton, IEEE Trans. Electron Devices 50, 906 (2003).
12. D. K. Schroder, IEEE Trans. Electron Devices 29, 1336 (1982).
13. G. Fortunato and P. Migliorato, Appl. Phys. Lett. 49, 1025 (1986).
14. O. K. B. Lui and P. Migliorato, Solid-State Electron. 41, 575 (1997).
15. A. G. Kazanskii, H. Mell, E. I. Terukov, and P. A. Forsh, Semiconductors 35, 953 (2001).
16. P. P. Altermatt and G. Heiser, J. Appl. Phys. 92, 2561 (2002).
17. K. R. Tarreto, Ph.D. thesis, University of Stuttgart, 2003.
18. T. Weis, R. Lipperheide, U. Wille, and S. Brehme, J. Appl. Phys. 92, 1411 (2002).
19. R. Lieperheide, T. Weis, and U. Wille, J. Phys.: Condens. Matter 13, 3347 (2001).
20. A. T. Voutsas, D. N. Kouvatsos, L. Michalas, and G. J. Papaioannou, IEEE Electron Device Lett. 26, 181 (2005).
21. R. Vanderhaghen, S. Kasouit, J. Damon-Lacoste, F. Liu, and P. Roca i Cabarrocas, J. Non-Cryst. Solids 338-340, 336 (2004).