XPS characterization on the Mn-doped BST thin films prepared by sol-gel method

Integrated Ferroelectrics

Volumn 45, Issue , 2002, Pages 31-38

  Bao, Jun Bo ^a,b   Ren, Tian Ling ^a   Liu, Jian She ^a   Wang, Xiao Ning ^a   Liu, Li Tian ^a   Li, Zhi Jian ^a   Li, Xing Jiao ^b  

^a TSINGHUA UNIVERSITY   (China)

^b HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

BaSrTiO3; BST thin film; ESCA; Mn(II) doped; Sol gel; XPS

Indexed keywords

BINDING ENERGY; DOPING (ADDITIVES); FERMI LEVEL; MANGANESE; SOL-GELS; SOLUTIONS; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

DOPANTS; PEAK SHIFTS; STOCK SOLUTION;

THIN FILMS;

EID: 31644444399     PISSN: 10584587     EISSN: 16078489     Source Type: Journal    
DOI: 10.1080/713718226     Document Type: Article

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